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List: smartmontools-support
Subject: [smartmontools-support] FUJITSU drive failing?
From: Ciro Scognamiglio <c.scognamiglio () oltrelinux ! com>
Date: 2008-09-26 23:03:16
Message-ID: 200809270103.17560.c.scognamiglio () oltrelinux ! com
[Download RAW message or body]
Hi all,
I have this problem with a brand new 2.5" sata drive.
As you can see below it has 187 Hours activity, I've just made a short test.
I was going to use it with a small mini-itx board, VIA CN700 chipset, and this
system should be on 24h/7d (small home server).
what scares me are the values below...Reallocated_Sector_Ct is really
high...Reallocated_Event_Count also...is that normal?
is there anything I can do to test the drive? I already copied som GBs of
multimedia files, I had no problems so far.
I have installed CentOS 5.2, kernel version is: 2.6.18-92.1.13.el5
thank you.
Ciro.
[root@vicky ~]# smartctl -d ata -a /dev/sda
smartctl version 5.36 [i686-redhat-linux-gnu] Copyright (C) 2002-6 Bruce Allen
Home page is http://smartmontools.sourceforge.net/
=== START OF INFORMATION SECTION ===
Device Model: MHW2160BH
Serial Number: K102T7828R9K
Firmware Version: 0000001C
User Capacity: 160,041,885,696 bytes
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: 8
ATA Standard is: Not recognized. Minor revision code: 0x52
Local Time is: Sat Sep 27 00:43:35 2008 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection:
Disabled.
Self-test execution status: ( 0) The previous self-test routine
completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 649) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off
support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 92) minutes.
Conveyance self-test routine
recommended polling time: ( 2) minutes.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED
WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 100 100 046 Pre-fail
Always - 137915
2 Throughput_Performance 0x0005 100 100 030 Pre-fail
Offline - 39059456
3 Spin_Up_Time 0x0003 100 100 025 Pre-fail
Always - 1
4 Start_Stop_Count 0x0032 100 100 000 Old_age
Always - 110
5 Reallocated_Sector_Ct 0x0033 100 100 024 Pre-fail
Always - 8589934592000
7 Seek_Error_Rate 0x000f 100 100 047 Pre-fail
Always - 2460
8 Seek_Time_Performance 0x0005 100 100 019 Pre-fail
Offline - 0
9 Power_On_Hours 0x0032 100 100 000 Old_age
Always - 187
10 Spin_Retry_Count 0x0013 100 100 020 Pre-fail
Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age
Always - 110
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age
Always - 41
193 Load_Cycle_Count 0x0032 100 100 000 Old_age
Always - 6884
194 Temperature_Celsius 0x0022 100 100 000 Old_age
Always - 48 (Lifetime Min/Max 21/53)
195 Hardware_ECC_Recovered 0x001a 100 100 000 Old_age
Always - 8
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age
Always - 458752000
197 Current_Pending_Sector 0x0012 100 100 000 Old_age
Always - 0
198 Offline_Uncorrectable 0x0010 100 100 000 Old_age
Offline - 0
199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age
Always - 0
200 Multi_Zone_Error_Rate 0x000f 100 100 060 Pre-fail
Always - 25481
203 Run_Out_Cancel 0x0002 100 100 000 Old_age
Always - 3728036790662
240 Head_Flying_Hours 0x003e 200 200 000 Old_age
Always - 0
SMART Error Log Version: 1
ATA Error Count: 4
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 4 occurred at disk power-on lifetime: 30 hours (1 days + 6 hours)
When the command that caused the error occurred, the device was active or
idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 00 0f 00 00 e0 Error: ICRC, ABRT at LBA = 0x0000000f = 15
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 0e 02 00 00 e0 00 00:00:30.123 READ DMA EXT
25 00 01 01 00 00 e0 00 00:00:30.123 READ DMA EXT
25 00 01 00 00 00 e0 00 00:00:30.123 READ DMA EXT
c6 00 10 00 00 00 e0 00 00:00:30.122 SET MULTIPLE MODE
91 00 3f 00 00 00 ef 00 00:00:30.093 INITIALIZE DEVICE PARAMETERS
[OBS-6]
Error 3 occurred at disk power-on lifetime: 30 hours (1 days + 6 hours)
When the command that caused the error occurred, the device was active or
idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
0c 51 01 01 00 00 a0
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
ec ff 01 01 00 00 a0 00 00:00:10.168 IDENTIFY DEVICE
a1 ff 01 01 00 00 a0 00 00:00:09.765 IDENTIFY PACKET DEVICE
00 ff 01 01 00 00 00 84 00:00:03.875 NOP [Reserved subcommand]
Error 2 occurred at disk power-on lifetime: 30 hours (1 days + 6 hours)
When the command that caused the error occurred, the device was active or
idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 00 00 00 00 e0 Error: ICRC, ABRT at LBA = 0x00000000 = 0
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 01 00 00 00 e0 00 00:00:11.185 READ DMA EXT
b0 da 00 00 4f c2 e0 00 00:00:11.073 SMART RETURN STATUS
b0 d2 00 00 4f c2 e0 00 00:00:11.073 SMART ENABLE/DISABLE ATTRIBUTE
AUTOSAVE
b0 d8 00 00 4f c2 e0 00 00:00:11.072 SMART ENABLE OPERATIONS
91 00 3f 00 00 00 ef 00 00:00:11.072 INITIALIZE DEVICE PARAMETERS
[OBS-6]
Error 1 occurred at disk power-on lifetime: 30 hours (1 days + 6 hours)
When the command that caused the error occurred, the device was active or
idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
0c 51 01 01 00 00 a0
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
ec ff 01 01 00 00 a0 00 00:00:10.171 IDENTIFY DEVICE
a1 ff 01 01 00 00 a0 00 00:00:09.769 IDENTIFY PACKET DEVICE
00 ff 01 01 00 00 00 04 00:00:03.875 NOP [Reserved subcommand]
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours)
LBA_of_first_error
# 1 Short offline Completed without error 00% 187 -
# 2 Short offline Completed without error 00% 37 -
# 3 Extended offline Aborted by host 30% 37 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
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