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List: smartmontools-support
Subject: [smartmontools-support] Seagate ST3400633A has unknown attributes
From: Jens Seidel <jensseidel () users ! sourceforge ! net>
Date: 2006-08-30 20:01:50
Message-ID: 20060830200126.GA4389 () erde
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Hi,
I have a Seagate Barracuda 7200.9 ST3400633A which is (according to
knowndrives.cpp, revision 1.141) not yet in the database.
It contains a few unknown IDs and one of these Unknown_Attribute tests
failed.
root@dm7025:~# smartctl -H /dev/ide/host0/bus0/target0/lun0/disc
smartctl version 5.33 [mipsel-unknown-linux-gnu] Copyright (C) 2002-4 Bruce Allen
Home page is http://smartmontools.sourceforge.net/
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
Please note the following marginal Attributes:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
190 Unknown_Attribute 0x0022 037 025 045 Old_age Always FAILING_NOW 31581955620927
Is this critical?
I attached the output of smartctl -a,
Jens
["smartctl-a.dreambox.2" (text/plain)]
smartctl version 5.33 [mipsel-unknown-linux-gnu] Copyright (C) 2002-4 Bruce Allen
Home page is http://smartmontools.sourceforge.net/
=== START OF INFORMATION SECTION ===
Device Model: ST3400633A
Serial Number: 3PM05EAQ
Firmware Version: 3.AAD
User Capacity: 400,088,457,216 bytes
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: 7
ATA Standard is: Exact ATA specification draft version not indicated
Local Time is: Wed Aug 30 14:48:06 2006 UTC
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
See vendor-specific Attribute list for marginal Attributes.
General SMART Values:
Offline data collection status: (0x82) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 113) The previous self-test completed having
the read element of the test failed.
Total time to complete Offline
data collection: ( 430) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 179) minutes.
SMART Attributes Data Structure revision number: 10
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED \
WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x000f 095 084 006 Pre-fail \
Always - 53482512 3 Spin_Up_Time 0x0003 097 096 000 \
Pre-fail Always - 0 4 Start_Stop_Count 0x0032 100 100 020 \
Old_age Always - 581 5 Reallocated_Sector_Ct 0x0033 100 100 \
036 Pre-fail Always - 0 7 Seek_Error_Rate 0x000f 074 060 \
030 Pre-fail Always - 25613304 9 Power_On_Hours 0x0032 \
097 097 000 Old_age Always - 2984 10 Spin_Retry_Count \
0x0013 100 100 097 Pre-fail Always - 0 12 Power_Cycle_Count \
0x0032 100 100 020 Old_age Always - 37 187 Unknown_Attribute \
0x0032 070 070 000 Old_age Always - 30 189 Unknown_Attribute \
0x003a 100 100 000 Old_age Always - 0 190 Unknown_Attribute \
0x0022 052 025 045 Old_age Always In_the_past 31336889843760 194 \
Temperature_Celsius 0x0022 048 075 000 Old_age Always - 48 \
(Lifetime Min/Max 0/29) 195 Hardware_ECC_Recovered 0x001a 048 043 000 \
Old_age Always - 19793602 197 Current_Pending_Sector 0x0012 100 \
100 000 Old_age Always - 1 198 Offline_Uncorrectable 0x0010 \
100 100 000 Old_age Offline - 1 199 UDMA_CRC_Error_Count \
0x003e 200 200 000 Old_age Always - 0 200 \
Multi_Zone_Error_Rate 0x0000 100 253 000 Old_age Offline - 0 \
202 TA_Increase_Count 0x0032 100 253 000 Old_age Always - \
0
SMART Error Log Version: 1
ATA Error Count: 30 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 30 occurred at disk power-on lifetime: 2757 hours (114 days + 21 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 2c 12 b8 e0 Error: UNC at LBA = 0x00b8122c = 12063276
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 08 26 12 b8 e0 00 14:45:19.272 READ DMA EXT
25 00 08 26 12 b8 e0 00 14:45:17.493 READ DMA EXT
25 00 08 26 12 b8 e0 00 14:45:17.413 READ DMA EXT
25 00 08 26 12 b8 e0 00 14:45:17.413 READ DMA EXT
25 00 08 26 12 b8 e0 00 14:45:15.641 READ DMA EXT
Error 29 occurred at disk power-on lifetime: 2757 hours (114 days + 21 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 2c 12 b8 e0 Error: UNC at LBA = 0x00b8122c = 12063276
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 08 26 12 b8 e0 00 14:45:19.272 READ DMA EXT
25 00 08 26 12 b8 e0 00 14:45:17.493 READ DMA EXT
25 00 08 26 12 b8 e0 00 14:45:17.413 READ DMA EXT
25 00 08 26 12 b8 e0 00 14:45:17.413 READ DMA EXT
25 00 08 26 12 b8 e0 00 14:45:15.641 READ DMA EXT
Error 28 occurred at disk power-on lifetime: 2757 hours (114 days + 21 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 2c 12 b8 e0 Error: UNC at LBA = 0x00b8122c = 12063276
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 08 26 12 b8 e0 00 14:45:19.272 READ DMA EXT
25 00 08 26 12 b8 e0 00 14:45:17.493 READ DMA EXT
25 00 08 26 12 b8 e0 00 14:45:17.413 READ DMA EXT
25 00 08 26 12 b8 e0 00 14:45:17.413 READ DMA EXT
25 00 08 4e 21 7d e0 00 14:45:15.641 READ DMA EXT
Error 27 occurred at disk power-on lifetime: 2757 hours (114 days + 21 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 2c 12 b8 e0 Error: UNC at LBA = 0x00b8122c = 12063276
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 08 26 12 b8 e0 00 14:45:19.272 READ DMA EXT
25 00 08 26 12 b8 e0 00 14:45:17.493 READ DMA EXT
25 00 08 26 12 b8 e0 00 14:45:17.413 READ DMA EXT
25 00 08 4e 21 7d e0 00 14:45:17.413 READ DMA EXT
25 00 08 26 12 b8 e0 00 14:45:15.641 READ DMA EXT
Error 26 occurred at disk power-on lifetime: 2757 hours (114 days + 21 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 2c 12 b8 e0 Error: UNC at LBA = 0x00b8122c = 12063276
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 08 26 12 b8 e0 00 14:45:19.272 READ DMA EXT
25 00 08 26 12 b8 e0 00 14:45:17.493 READ DMA EXT
25 00 08 4e 21 7d e0 00 14:45:17.413 READ DMA EXT
25 00 08 26 12 b8 e0 00 14:45:17.413 READ DMA EXT
25 00 08 26 12 b8 e0 00 14:45:15.641 READ DMA EXT
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) \
LBA_of_first_error # 1 Extended offline Completed: read failure 10% \
2966 750260780
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
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